Scanning two-grating free electron Mach-Zehnder interferometer

نویسندگان

چکیده

We demonstrate a two-grating free electron Mach-Zehnder interferometer constructed in transmission microscope. A symmetric binary phase grating and condenser lens system form two spatially separated, focused probes at the sample which can be scanned while maintaining alignment. The paths interfere second grating, creating constructive or destructive interference output beams. This has many notable features: positionable probe beams, large path separations relative to beam width, continuously tunable between paths, real-time information. Here we use measure shifts imparted by electrostatic potentials as well demonstration of quantitative nanoscale imaging polystyrene latex nanoparticle.

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ژورنال

عنوان ژورنال: Physical review research

سال: 2021

ISSN: ['2643-1564']

DOI: https://doi.org/10.1103/physrevresearch.3.043009